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FaNU03

  • E. Farchi, Y. Nir, and S. Ur, “Concurrent Bug Patterns and How to Test Them,” In Proceedings of the 17th International Symposium on Parallel and Distributed Processing, pp.286-292, IEEE, 2003
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pub/fanu03.txt · Last modified: 2014-07-16 12:35 by Hyun-Ji Kim